We report on the investigation of morphology, magnetic and conductive properties of the mutilayered nanostructures [(Co40Fe40B20)34(SiO2) 66]/[C]47 consisting of the contacting magnetic (Co40Fe40B20)34(SiO2) 66 nanocomposite and amorphous semiconductor carbon C layers. It is shown by Grazing-Incidence Small-Angle X-ray Scattering method that the ordering and the size of nanoparticles in the magnetic layers do not change profoundly with increasing of carbon layer thickness. Meanwhile, the electrical conductance and the magnetic properties are significantly varied: resistance of the samples changes by four orders of magnitude and superparamagnetic blocking temperature changes from 15 K to 7 K with the increment of carbon layer thickness hc from 0.4 nm to 1.8 nm. We assume that the formation of the homogeneous semiconductor interlayer leads to modification of the metal-insulator growth process that drives the changes in the magnetic and conductive properties.