Study of Inverse Ni-based Photonic Crystal using the Microradian X-ray Diffraction

Authors:
A.V. Vasilieva, N.A. Grigoryeva, A.A. Mistonov, N.A. Sapoletova, K.S. Napolskii, A.A. Eliseev, A.V. Lukashin, Yu.D. Tretyakov, A.V. Petukhov, D. Byelov, D. Chernyshov, A.I. Okorokov, W.G. Bouwman, S.V. Grigoriev
Authors from CMD:
The year of the publication:
2010
Journal:
Journal of Physics: Conference Series N 1 vol. 247 012029
Abstract:

Inverse photonic nickel-based crystal films formed by lectrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 = 650 ± 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC… and ACBACB… ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 ± 0.1 mkm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length Llong is 3.4 ± 0.2 mkm, and the structure mosaic is of order of 10

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