Study of Inverse Ni-based Photonic Crystal using the Microradian X-ray Diffraction
                Авторы:
			
			
				A.V. Vasilieva, N.A.  Grigoryeva,  A.A.  Mistonov, N.A.  Sapoletova, K.S. Napolskii, A.A.  Eliseev, A.V.  Lukashin, Yu.D. Tretyakov, A.V. Petukhov, D. Byelov, D. Chernyshov, A.I. Okorokov, W.G.  Bouwman, S.V. Grigoriev 
			
		
                    Авторы из ОИКС:
			
			
		
                    Год публикации:
			
			
				2010
			
		
                    Журнал:
			
			
				Journal of Physics: Conference Series
				
					N 1
				
				
					vol. 247
				
				
					012029
				
			
		
                    Абстракт:
			
			Inverse photonic nickel-based crystal films formed by lectrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 = 650 ± 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC… and ACBACB… ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 ± 0.1 mkm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length Llong is 3.4 ± 0.2 mkm, and the structure mosaic is of order of 10